Applied Standards

• GB/T 3655-2000   Methods of measurement of the magnetic properties of electrical steel sheet and strip by means of an Epstein frame
• GB/T 13789-2008  Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester
• GB/T 3658-2008   Methods of measurement of a.c.magnetic properties of magnetically soft materials
• IEC 60404-2      Methods of measurement of the magnetic properties of electrical steel sheet and strip by mesns of an Epstein frame
• IEC 60404-3      Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester
• IEC 60404-6     Methods of measurement of a.c.magnetic properties of magnetically soft materials

Measured Parameters

Total loss ratio (Ps)  Magnetic polarization (Jm)  Magnetic field strength (Hm)  Exciting power (Ss)  Amplitude permeability (µa)  Loss angle (δ)  Residual Magnetic flux density (Br)  Coercivity (Hc)  B(H) hysteresis loop  B(H) hysteresis loop cluster  B(H) magnetization curve  µa(H) permeability curve  Ps(B) loss curve  Calculate μ′, μ″, μL, μR, Q and Ai  under certain conditions

Main Features

1. Adopted digital power source and A/D card instead of old analog power source, frequency meter, amperemeter, voltmeter and wattmeter.
2. Perfectly match Windows system, easy to operate.
3. Test Samples: hot&cold rolled silicon steel(oriented or non-oriented), permalloy, amorphous alloy and nanocrystalline.
4. Sample shape: ribbon and chip open samples, ring, E&U shape etc closed-circuit samples.
5. Open circuit samples adopt Epstein Square to form closed magnetic circuit, it can also select permeameter. Closing sample can be put under direct winding measurement, finished transformer can be also put under direct measurement.
6. A non-load transformer included a sample core, a magnetizing turns(N1) and a measuring turns(N2).
7. N1 connected non-inductive resistance, to define the magnetizing current by testing the descending voltage of the non-inductive resistance to get the field strength. Peak value lock feedback by digits, field lock accuracy is 0.5%.
8. Get flux induction by digital analyzing the N2 voltage,Peak value lock feedback by digits, induction lock accuracy is 0.2%.
9. Power source and sampling amplifier embedded in one case with simple interfaces: a computer-connect inferface RS232, two-way voltage signal connect to A/D card.
10. Use voltammetry and DDA to test magnetic property like dynamic hysteresis loop, Ps, Jm, Hm, Ss, μa, loss angle, Br and Hc.
11. Constantly test over 255 points, each one cost 30 seconds, fixed frequency, lock Bm or lock Hm modes optional.

Software Functions

1. Perfectly match Windows 7. English & English-Chinese version optional. Easy to operate.
2. Lock Bm or Lock Hm oprtioal, multiple choices.
3. Full-automatic operation. Intelligent auto-recognition.
4. Measuring process in real time monitoring, can be suspended at any time.
5. Automatic calculating. Be able to do results conversion according to temperature.
6. Adopted data base format, directly print or output test results to Excel.
7. Document function: data save, data delete, remove whole data etc.
8. Reports include full sample data, sample parameters, device parameters and test schemes. Text format, easy to output.
9. Display I(t), U(t), B(t)curves and B(H) hysteresis loop. Coordinates of each points on the curves canbe also displayed.
10. After multiple points clustering, display B(H) hysteresis loop cluster, B(H) magnetizing curve, μa(H) permeability curve and Ps(B) loss curve. Coordinates of each points on the curves   canbe also displayed.
11. Set B(H) magnetizing curve and Ps(B) together on one chart, easy to analysis.
12. Set limits according to μa, Ps, Bm, Br, Hc and Hm. Define and color the passed results.
13. Support various kinds of printers. Test reports perfectly match the print sheet.
14. Print preview, easy to adjust the reports size and edge.
15. Print reports directly or convert the report to graphic file JPG.
16. Built-in e-mail sending function.
17. Test reports include full curve graphic, test results, test conditions and sample parameters. Chinese & English version alterable, able to add clients information.

Software Interface

Test Reports

Technical Parameters

1、According to GB/T 3655-2000，under 50Hz. 60Hz., test 30×300mm silicon steel by 25cm Epstein frame, reports as following:

Parameters	Ps(%)	Ss(%)	Hrms(%)	Bm(%)	Hm(%)
Uncertainty(k=2)	1	1	2	1	2
Repeatability	± 0.5	± 0.5	± 1	± 0.5	± 1
Remarks	Lock Bm: non oriented Bm≤1.5T Oriented   Bm≤1.7T		Lock Hm:non orientedHm≥1000A/m OrientedHm≥500A/m

2、According to GB/T 13789-2008，under 50Hz、60Hz，test 500×500mm silicon steel by SST-500 permeameter, reports as following:

Parameters	Ps(%)	Ss(%)	Hrms(%)	Bm(%)	Hm(%)
Uncertainty(k=2)	1.5	1.5	2	1	3
Repeatability	± 0.5	± 0.5	± 1	± 0.5	± 1
Remarks	Lock Bm: non oriented Bm=0.8~1.5T Oriented    Bm=1.0~1.8T		Lock Hm:non orientedHm≤10000A/m OrientedHm≤1000A/m

3. According to GB/T 3658-2008，under 50Hz～1kHz，test permalloy, reports as following:

Parameters	Ps(%)	Ss(%)	Hrms(%)	Bm(%)	Hm(%)
Uncertainty(k=2)	2	3	-	1	3
Repeatability	± 1.5	± 1	± 1	± 0.5	± 0.5
Remarks	1. Samples should be thin ring, OD/ND＜1.25. 2. Demagnetizing before testing and frequency of demagnetizing should be less than or equal to test frequency. 3. Uncertainty is “-”, means there is no requirement in the National Standard.

Hardware Parameters

Technical Data	201M/K50	201M/K75	201M/10K
Max. Output Power	500 VA sine wave	750 VA sine wave	500 VA sine wave
Frequency Range	45 Hz ~ 1000 Hz		400Hz~10kHz
Frequency Fineness	1 Hz
Frequency Error	< 0.05%
Output Voltage	0~10V~50V~150V~300V	0~10V~50V~80V~100V	0~10V~50V~150V~300V
Voltage Fineness	Program Control 1 mV, panel < 0.1%×current range
Voltage Distortion Factor	Superior to 0.5%
Voltage Stability	Superior to 0.02%
Sampling Current	5mA~20A		6.33mA~20A
Sampling Voltage	100mV~400V		1V~316V
Max. Voltage	300V	100V	300V
Max. Current	10A	15A	10A
Measurement materials	hot rolling, cold rolling silicon steel materials, permalloy, amorphous and nm crystal.
Sample shape	ribbon and chip open samples, toroid, E and U closing samples
Sample size	For Epstein Frame : 30 mm x（280mm~ 300 mm） For SST-500 Permeameter : 500mm x500mm For customized Permeameter: decided by the Permeameter For E and U closing samples , no physical limitation, size affects the max H field,
Accuracy (Ps)	1% (50Hz, Epstein Frame)	1.5% (50Hz, Permeameter)	3%(10KHz, ring)
Test Time	30s	30s	12s
Operating temperature	23±5℃

Configuration

201M/K50	201M/K75	201M/10K
201M Hysteresisgraph	201M Hysteresisgraph	201M Hysteresisgraph
PC6111 A/D Card	PC 6112 A/D Card	PC 6684 A/D Card
Measurement Software	Measurement Software	Measurement Software
Computer	Computer	Computer
Printer	Printer	Printer
Epstein Frame	Epstein Frame	Standard Specimen
Square Standard Specimen	Square Standard Specimen

CAUTION:
As the products of our company are in constant updates, the change of products without pre-notice.

Accessories

Model	ES-700 Epstein Fram	ES-200 Mid Band Frame
Test Equipment
Environment Temperature	23℃5±℃	23℃5±℃
Humidity	＜65%	＜65%
Equivalent Magnetic Circuit	940mm	940mm
Winding Turns	N1 700 turns, N2 700 turns	N1 200 turns, N2 200 turns
Specimens Size	Width: 30mm±0.2mm, length: 280~320mm±0.5mm	Width: 30mm±0.2mm, length: 280~320mm±0.5mm
Sample Mass	240g~1000g	240g~1000g
Applied Frequency	DC~400Hz	400Hz~10kHz

Model	Customized Permeameter	Soft magnet core automatic test tooling
Test Equipment
Environment Temperature	23℃5±℃	23℃5±℃
Humidity	＜65%	＜65%
Equivalent Magnetic Circuit	300mm×300mm, 300mm×30mm, 100mm×100mm, 50mm×50mm	N/A
Winding Turns	N/A	N/A
Specimens Size	N/A	N/A
Sample Mass	N/A	N/A
Applied Frequency	50Hz and 60Hz	N/A